Office of Research and Project Administration

Description of Facility:
We have X-ray Photoelectron and Auger Electron Spectroscopy (XPS and AES) for surface analysis. XPS and AES are surface sensitive techniques that can be used for quantitative and semi-quantitative elemental and chemical analysis. Standard sample heating and Ar ion sputter-cleaning are available. For more sophisticated electronic structure analysis Inverse Photoemission Spectroscopy (IPES), Electron Energy Loss Spectroscopy, and Ultraviolet Photoemission Spectroscopy (UPS) are also available. The sample size equipment is typically 1 cm X 1 cm X 1mm. Circular samples with 1 cm diameter can also be accommodated. The cost is $80 per hour.